gate oxide
creation of multiple gate oxide with high thickness ratio in
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gate formation (i) sac oxide remove gate1 oxide dep
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statistical theoretical analysis method of tddb of gate oxide
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可靠性系列gateoxidedegradation
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03 gate oxide degradation
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dual gate oxide structure in semiconductor device and method
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statistical theoretical analysis method of tddb of gate oxide
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gate oxide short defect model in finfets
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system and method for testing gate oxide of an amplifier
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03 gate oxide degradation
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method of fabricating a dual gate oxide
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trench semiconductor device having gate oxide layer with
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high-density plasma multilayer gate oxide
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method of simulation for gate oxide integrity check on an entire
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thermal dual gate oxide device integration
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method of forming a low voltage gate oxide layer and tunnel
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method of forming nitrogen implanted ultrathin gate oxide for
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method for determining transistor gate oxide thickness
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use of oxide surface to facilitate gate break on a carrier
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专利us6753229 - multiple-thickness gate oxide formed by oxygen
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